Used KLA / TENCOR Alpha Step 200 #9208490 for sale

KLA / TENCOR Alpha Step 200 is an advanced wafer testing and metrology equipment designed to provide accurate, real-time surface analysis of semiconductor wafers. KLA ALPHASTEP 200 is capable of measuring both the shape and surface quality of wafers with high resolution down to the nanometer level. The system has several features that set it apart from other testing systems, including a multi-directional scanning head, a 3D optical profilometer, and a vision metrology unit for nanometer-level surface deformation measurements. TENCOR ALPHA-STEP 200's multi-directional scanning head is capable of measuring surface features from multiple directions, providing comprehensive information on wafer shape and surface texture. This is supplemented by a 3D optical profilometer, which can provide surface profile measurements with high accuracy. The vision metrology machine provides nanometer-level surface deformation measurements, which allow for unprecedented insight into the production process. KLA Alpha Step 200's advanced software provides automated analysis and reporting capabilities which can be customized to provide tailored data in various formats. This allows engineers to quickly and easily review results, identify errors or inconsistencies in the process, and take corrective action. ALPHA-STEP 200 is also capable of real-time measurements, allowing engineers to monitor the production process as it is occurring. This can be useful for preventing defects in the production process, allowing engineers to identify and correct any issues before they become major problems. To ensure reliable and repeatable results, TENCOR ALPHASTEP 200 utilizes an automated calibration routine to maintain tool accuracy and stability. The asset is also compatible with a variety of peripherals and other test and measurement equipment. All data collected by KLA ALPHA-STEP 200 is securely stored, allowing for future review and analysis. Overall, TENCOR Alpha Step 200 is an advanced wafer testing and metrology model capable of providing detailed information with high accuracy. It's sophisticated features and automated data analysis options allow it to be used for a variety of applications, from production process inspections to defect detection and beyond.