Used KLA / TENCOR Alpha Step 200 #9284319 for sale

KLA / TENCOR Alpha Step 200 is a high-performance wafer testing and metrology equipment designed to meet the needs of the semiconductor industry. It is designed to detect defects, anomalies, and materials characterization during the manufacturing process of integrated circuits. KLA ALPHASTEP 200 provides superior resolution, repeatability and accuracy in measurement of 1D and 2D features. The system features a high-speed optical imaging subsystem, providing users with the ability to detect and measure both visible and non-visible features on semiconductor wafers very quickly. Furthermore, it includes advanced scanning optics to accurately capture images, while eliminating the use of expensive, physics-based probes and testers. TENCOR ALPHA-STEP 200 is also equipped with a powerful image acquisition, image processing, data analysis and metrology module. This module contains an array of algorithms designed to identify different types of defects and material parameters. Furthermore, the state-of-the-art autofocus and scanning systems ensures that the imaging and data analysis processes are accurate and repeatable. To ensure reliability and accuracy, the unit is built with a number of advanced technologies, such as high-resolution photoscanners, high-speed imaging, optics coatings and automated calibration systems. This ensures that users are able to capture and process more data at improved speeds. KLA Alpha Step 200 includes integrated storage and software options such as 3D and 2D mapping, 3D simulation and device optimization. These features allow engineers to perform more complex and detailed analysis for device reliability and performance. In addition to semiconductor metrology, KLA / TENCOR ALPHASTEP 200 can also be used for production line testing, quality control and failure analysis. This makes Alpha Step 200 a valuable tool in a variety of applications. KLA ALPHA-STEP 200 is an advanced wafer testing and metrology machine designed to provide manufacturers and scientists with a comprehensive solution for metrology and device reliability. Its powerful combination of imaging, metrology and data analysis modules ensures that engineers and technicians have the information they need to analyze, monitor and test wafers.