Used KLA / TENCOR Alpha Step 200 #9398835 for sale

KLA / TENCOR Alpha Step 200 is a wafer testing and metrology equipment specifically developed for high-performance IC materials characterization. The system's two-stage imaging architecture combines enhanced automated metrology and defect inspection capabilities that enable quantification of process variation. It provides customers with real-time visibility and improved defect criticality metrics to rapidly identify the origins of defects and reduce root cause analysis times. KLA ALPHASTEP 200 features the industry's first on-wafer magnification of up to 1000x, allowing for the capture of detailed surface information. This magnification allows for the visualization of small-scale variables, allowing for an in-depth analysis of the lithography process. With its advanced imaging platform and software suite, TENCOR ALPHA-STEP 200 can detect and quantify variables that are impossible to measure with traditional methods. The unit's automated metrology software suite combines with patented imaging capabilities to enable a quantitative 2D analysis of wafers or of individual wafer sites. The software's powerful algorithms and automated measurement systems allow for accurate defect detection and automated measurements, even on aggressively placed structures. KLA / TENCOR ALPHA-STEP 200's unique patented wafer mosaic capabilities provide users with a continuous image over the entire die area. This enables a detailed understanding of applications such as e-beam inspection and 3D CMP flattening. This also provides users with more information when deciding on how to optimize their process. KLA Alpha Step 200 is designed for high productivity and ease of use by operators. The machine can be integrated with other software and hardware systems and incorporates pass/fail criteria based on templates and image-based analysis. The user-friendly software package also provides customers with an intuitive, easy-to-use environment, enabling quick and efficient training of personnel. When used in conjunction with its extensive suite of software, accessories and image analysis tools, Alpha Step 200 offers customers an extremely powerful tool for IC metrology and defect inspection. Customers benefit from its ability to measure small-scale variables, while also having access to comprehensive automated metrology data. The tool's unprecedented level of magnification and defect detection capabilities make it an ideal choice for semiconductor manufacturers looking to rapidly identify and address process variations.