Used KLA / TENCOR Alpha Step 250 #9284473 for sale

KLA / TENCOR Alpha Step 250 wafer testing and metrology equipment provides ultra-fast and accurate measurements of integrated circuit (IC) structures and process layers on semiconductor wafers. It is equipped with a non-contact white light interferometer, which utilizes advanced optical techniques to measure surface properties, such as topography and roughness of semiconductor wafers, from micron to angstrom scales. The system also supports other metrology techniques, such as integrated focused ion beam (FIB) and transport of ionized species (TIS) technologies, for accurate and precise measurements of device layers and circuit structures. The unit is highly reliable, with total test repeatability error (TRRE) below 4% for wafers up to 200 mm in diameter. Using KLA Alpha Step 250, wafer measurements can be carried out at line speed, with a maximum throughput of 150 wafers per hour, with an enhanced image processing speed of 10 us/pixel. Its built-in deep learning algorithms enable accurate and efficient measurements, while its intelligent layer recognition allows the identification of layers and processes during post-processing. TENCOR Alpha Step 250 provides comprehensive measurement data capabilities, including scanning electro-microscopy (SEM), I-V testing, and parameter extraction. Additionally, its wide operating temperature range between 25 and 85 °C allows the machine to work in a wide variety of environmental conditions. Its built-in on-board automation enables top surface imaging and defect inspections in a continuous and automated flow. Alpha Step 250 is also user-friendly and easily configurable, allowing it to be customized for various applications. It supports a variety of post-processing tools, such as graph-based algorithms for automated topographic feature extraction, non-parametric statistical methods for defect-based classification analysis, and visualization techniques for easy review of wafer data. The platform also provides an intuitive web-based user interface, allowing users to easily control, monitor, and configure the tool from any remote location. KLA / TENCOR Alpha Step 250 is one of the most advanced and accurate wafer testing and metrology systems available. With its high-precision scanning, increased speed, and versatile post-processing tools, it is an excellent choice for wafer testing applications.