Used KLA / TENCOR Alpha Step 300 #293662991 for sale

KLA / TENCOR Alpha Step 300 is a wafer testing and metrology equipment designed to improve yield, reduce cost, and increase production efficiency. The system can analyze both bare and patterned wafers, and is capable of identifying defects with unsurpassed accuracy. KLA Alpha Step 300 uses laser interferometer scanning to obtain surface topography data for both top surface metrology and cross-sectional metrology. It also features multiple microscopes for high magnification inspection. A fully automated image acquisition and analysis unit ensures achieve precise measurements and uniformity. TENCOR ALPHASTEP 300 is compatible with a wide variety of substrates and is able to measure both physical and electrical parameters, including resistivity, stroke, surface roughness, linewidth, slope/angle, contour and delta z. Its intelligent defect simulation algorithms allow it to identify subtle defects such as soil in resistive patterns and thin-film spiking. It also provides an output stage for writing inspection parameters to files. A user-friendly graphical interface helps operators of all skill levels navigate the machine quickly and intuitively. The user interface provides visual feedback as measurements are taken, ensuring that measurement results are accurately documented. Furthermore, a sophisticated statistical process control package ensures that results meet predetermined standards. TENCOR Alpha Step 300 is extremely reliable and has been proven to improve production efficiency, yield, and reduce cost. Its accuracy and speed enable it to effectively identify and analyze subtle defects on semiconductor wafers, ensuring high quality and reducing yield loss. For these reasons and more, ALPHASTEP 300 is an excellent choice for any front-end automation and wafer testing application.