Used KLA / TENCOR Alpha Step 300 #293757103 for sale

KLA / TENCOR Alpha Step 300 is a sophisticated wafer testing and metrology equipment used in the miniaturization of advanced semiconductor devices. Utilizing patented Scanning White Light Interferometry technology, the system is capable of measuring and inspecting the surface of semiconductor wafers for defects and other irregularities. KLA Alpha Step 300 platform delivers high-precision, high-throughput, repeatable measurements for performance-enhanced production and yield improvement with minimal operator intervention. The systems low-noise, high-speed interferometer employs 180 parallel channels to measure numerous features, such as line/space widths, height variation and edge profile quickly and accurately. The unit is designed to perform transient testing, stress probing and real-time fault isolation at the device level, in addition to the metrology tests and inspections it performs. The machine is capable of detecting defects ranging from 85 nm to 19 microns in size. It is also capable of performing multiple measurements simultaneously, allowing for faster throughput and better yields. TENCOR ALPHASTEP 300 platform uses advanced software to control and analyze the data. The SmartStep software and OptiVu I+I probes work together to optimize measurement performance, while the Tact™ software suite provides an easy-to-use graphical user interface for data management and analysis. The tool also includes a variety of tool kits for custom defect tests, automated 2D component recognition and defect classification. KLA ALPHASTEP 300 platform is powered by industry-leading hardware and innovative instrumentation. It includes a high-speed, high-throughput multi-sensor interferometer, high precision optics, optical head positioners, motion systems and motion controllers. ALPHASTEP 300 asset is constructed from durable and ergonomic materials to withstand rigorous testing in a variety of environments. The model is certified for cleanroom operations, including Class 10 and Class 100 classifications, and comes with an advanced safety suite that, when combined with its stable design, helps to ensure personnel safety and product quality. All in all, Alpha Step 300 wafer testing and metrology equipment is an advanced platform that performs a wide range of tests, inspections and analyses to help improve semiconductor device performance and yield. With its low-noise scanning interferometer, advanced software and tool kits, durable construction and advanced safety suite, the system provides reliable, high-precision results to improve the efficiency and accuracy of semiconductor production and quality control.