Used KLA / TENCOR Alpha Step 300 #9241507 for sale

ID: 9241507
Wafer Size: 6"
Vintage: 1993
Profilometer, 6" 1993 vintage.
KLA / TENCOR Alpha Step 300 is an advanced wafer testing and metrology system, designed to deliver accurate and reliable measurements of semiconductor wafers. KLA Alpha Step 300 is a user-friendly automated tool designed to provide high-precision, non-contact profiling measurements for a variety of semiconductor wafers. Its state-of-the-art technology enables it to accurately measure the characteristics of a wafer including oxide roughness, surface height, and step heights. TENCOR ALPHASTEP 300 features advanced optical metrology which provides reliable optical measurements with the highest precision. It is also equipped with patented technology for non-contact scanning and surface profiling, allowing it to measure surface step heights with a precision of 0.1 nm. In addition to its precision, KLA ALPHASTEP 300 also offers a variety of other features, including high throughput, advanced image processing, a user-friendly interface, and powerful analytics. The system also includes advanced tools such as profile fitting algorithms, real-time analysis capabilities, and error correction algorithms. Alpha Step 300 has been designed to be highly versatile and configurable, enabling it to accommodate a wide range of wafer sizes, shapes, and types. It is built with the latest high-performance image processing algorithms, allowing it to rapidly identify and profile surface structures, while ensuring reliable and repeatable measurement results. Overall, ALPHASTEP 300 is a powerful and precise wafer testing and metrology system, designed to meet the exacting requirements of today's advanced semiconductor applications. Its high accuracy and reliability make it an ideal solution for a variety of semiconductor wafer measurement applications.
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