Used KLA / TENCOR Alpha Step 500 #9081303 for sale

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ID: 9081303
Surface profiler Zoom optics provide magnification: Up to 210X for precise micro measurements Stylus force adjustable: Between 1 and 100mg Scan length: 10mm Resolution: (1) Angstrom Guaranteed repeatability of 10 angstroms 115V, 50/60 Hz.
KLA / TENCOR Alpha Step 500 is a high performance wafer testing and metrology equipment designed for failure analysis and submicron process control. The system is intended to be used for measurements of wafer flatness, edge quality, wafer thinning, and overlay at sub-micron levels. KLA Alpha Step 500 utilizes a multi-sensor platform utilizing laser interferometry, capacitive, and optical technologies to provide high accuracy measurements. The multi-sensor capability of the platform allows for the simultaneous measurement of multiple wafer properties such as wafer flatness, profile, overlay, thinning, and critical dimensions as well as edge analysis. TENCOR ALPHASTEP 500 features a modular design, allowing users to configure the unit to meet specific applications and needs. The machine is available in two sizes, with a desktop configuration of up to 20 sensors or a full two-tier configuration with up to 40 sensors. The tool also features an integrated web-browser based control interface that allows users to control the asset from any web-connected device, as well as a built-in video model for easy viewing of wafer alignment and quality. TENCOR Alpha Step 500 utilizes an advanced multi-beam sampler that enables improved wafer characterization as well as reliable and repeatable measurements. The equipment's measurement capabilities are further enhanced by its advanced algorithms and automation features, such as wafer tracing, scan rate adjustment, and wafer coordinate sets which allow for consistent data collection. The system is also capable of automated self-test routines for unit health monitoring to ensure continued performance and reduce costly service costs. KLA ALPHASTEP 500 is an industry-leading wafer testing and metrology unit that provides reliable and repeatable measurements at sub-micron levels. The machine utilizes a modular design and a multi-sensor platform to allow users to configure the tool to their specific applications and needs. The advanced features, such as the integrated web browser interface, multi-beam sampler, and automated self-test routines, ensure the asset delivers accurate and reliable results.
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