Used KLA / TENCOR Alpha Step D-100 #293607100 for sale

KLA / TENCOR Alpha Step D-100 is a high-performance wafer testing and metrology equipment designed for use in semiconductor production and nanotechnology development. The system is capable of 2D optical inspection and metrology for a variety of sample types at the 100nm resolution level. The unit is equipped with a precision XY stage with positioning accuracy of 5µm, allowing for high-resolution imaging of large areas. This XY stage is complemented by an advanced 5-axis tilt/rotation motorized platform, enabling the detailed examination of complex nanostructures. The machine includes proprietary X-ray laser wafer testing technology, allowing for accurate imaging of both inorganic and organic materials. This technology is based on the analysis of atoms emitted when X-rays are fired at the material sampled, which are then analyzed to produce an image of the sample. KLA Alpha Step D-100 includes a wide range of imaging tools, such as surface topography and defect analysis. This tool has the ability to assess surface texture, surface defects, and other geometries with a magnification of up to 2000x. These images can be used for defect analysis and for precise measurements of sub-micron features. The asset is also equipped with a 4-port Digital Metrology Station. This station features high-performance, high-accuracy linear scales that are capable of measuring both straight line and curved features. This station also features a High-Accuracy Digital Probe, which significantly reduces the data processing time by integrating automatic data transfer between the coordinates being measured and the central computer. Finally, TENCOR Alpha Step D-100 also has a suite of software tools for data analysis and reporting. This software suite is designed for a wide range of applications, including on-site inspection, process development, and final product testing. This provides the flexibility to generate detailed reports with the highest accuracy possible and allows customized analysis of data. In summary, Alpha Step D-100 is an advanced wafer testing and metrology model capable of fast and accurate imaging of materials at the nanometer level. This equipment includes proprietary X-ray technology, a wide range of imaging tools, and a 4-port Digital Metrology Station, as well as software tools for data analysis and reporting.