Used KLA / TENCOR Alpha Step IQ #193355 for sale

KLA / TENCOR Alpha Step IQ is a wafer testing and metrology platform that enables non-destructive characterization of samples over a wide range of device geometries. It features a high-resolution, low-noise scanning platform with a wide range of automated features to accurately measure feature-edge and profile characteristics. The equipment uses optical scatterometry to measure the shape and size of a sample's features. Captured images are then digitally analyzed to provide detailed information about the sample's dimensions. KLA Alpha Step IQ enables the investigation of key devices such as photovoltaic panels and MEMS sensors, as well as the comprehensive characterization of steps, trenches, and vias through optical scatterometry. Automated wafer alignment and reference calibration make the system an ideal platform for multiple-step metrology and defect inspection. It offers both qualitative and quantitative analysis, including 3D profile mapping, thickness measurements, and electric field simulations. Through a combination of powerful data acquisition and analysis tools, TENCOR ALPHASTEP IQ can provide a wide range of analytical capabilities. TENCOR Alpha Step IQ incorporates a high-speed HeNe laser and multiple optical detectors, providing unmatched sensitivity and resolution. Its high-precision X/Y/Z stages and advanced motorized imaging capabilities allow for both imaging and analysis of samples up to 200mm in size. It can also accommodate up to 6 samples at a time for high-throughput sample processing. In addition, it offers multiple modes of operation including benchtop and automated modes. Alpha Step IQ is highly customizable, enabling researchers to tailor the unit to their specific requirements. With its intuitive user interface and powerful software development tools, KLA / TENCOR ALPHASTEP IQ provides an ideal platform for device analysis. The machine is also compatible with standard LabVIEW software, making it easy to integrate into existing laboratory processes. In summary, KLA ALPHASTEP IQ is an advanced wafer testing and metrology platform that allows non-destructive characterization of samples, offering both qualitative and quantitative analysis. The tool's high-speed laser systems and superior imaging capabilities make it an ideal platform for multiple-step metrology and defect inspection. With its customizable features, powerful data acquisition and analysis tools, and standard LabVIEW compatibility, ALPHASTEP IQ enables researchers to tailor their asset to their specific requirements.