Used KLA / TENCOR Alpha Step IQ #293647760 for sale

KLA / TENCOR Alpha Step IQ is an automated wafer testing and metrology equipment designed for inspecting and measuring nanometer-scale features on semiconductor wafers. KLA Alpha Step IQ combines numerous features such as 3D optical microscopy, confocal microscopy, critical dimension scanning electron microscopy (CD-SEM), and image analysis tools to achieve a fast, accurate, and repeatable wafer inspection process. The system is well-suited for processing a variety of wafer types and sizes, including 300mm and 200mm diameter dielectric and optical microlithography wafers. The integrated 3D optical microscope is designed to capture images of features down to 5nm in size, while the confocal microscope can capture features down to 3nm. In addition, the CD-SEM is able to measure critical dimensions (CD) and materials uniformity with high accuracy and repeatability. The unit also offers a set of powerful software tools to complement its wafer inspection capabilities. The software suite includes a number of advanced image processing algorithms, enhanced defect analysis tools, and image stitching capabilities. These tools are designed to minimize the time required to analyze data, as well as increase user accuracy and productivity. TENCOR ALPHASTEP IQ also features a number of automated features designed to make wafer inspection easier. Automated optical navigation makes navigation between scanned images faster and more efficient. Automatic calibration ensures that each imaging step is performed with peak accuracy. In addition, Automatic Beam Detect and Autofocus capabilities ensure that each image is automatically focused accurately and thoroughly. ALPHASTEP IQ can also be customized to specific wafers, providing the user with maximum flexibility. Customizable software settings allow users to optimize the machine to their specific requirements. This makes KLA ALPHASTEP IQ an ideal choice for precision wafer inspection and measurement applications.