Used KLA / TENCOR Alpha Step IQ #293671820 for sale

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ID: 293671820
Vintage: 2010
Surface profiler 2010 vintage.
KLA / TENCOR Alpha Step IQ is a wafer testing and metrology equipment designed to ensure accurate and reliable data for error detection in wafer fabrication. KLA Alpha Step IQ is a critical tool for quality control and process monitoring as it provides quality assurance in the production of semiconductor wafers. TENCOR ALPHASTEP IQ uses Non-contact Edge Detection and 3D Imaging technologies to ensure error-free and dependable metrology results. The Edge Detection technology provides a method for measuring the height profile of a wafer in a non-contact manner. The 3D Imaging technology allows for real-time, point-by-point evaluation of the surfaces of the wafer for any defects. These two technologies are used in combination to provide accuracy in the measurement of the height profile, as well as the accurate detection of any defects on the wafer. In addition, TENCOR Alpha Step IQ has the ability to scan wafers at high speeds while maintaining excellent accuracy. This provides a significant advantage when compared to other wafer testing systems as it allows for higher throughput while still ensuring dependable results. KLA / TENCOR ALPHASTEP IQ also has a wide range of additional features to ensure complete data accuracy. For example, the system includes automated focus adjustment to guarantee accurate depth measurements, advanced illumination modules to ensure clear imaging, and advanced SEM algorithms to optimize wafer inspection. ALPHASTEP IQ is an essential tool for quality control and metrology in wafer fabrication, the unit provides accurate and reliable data to allow for the detection of errors in the production process. The machine includes a wide range of advanced technologies to ensure excellent accuracy in the measurement of the wafer's height profile and a high throughput of wafer inspections. Through its combination of Non-contact Edge Detection and 3D Imaging technologies, Alpha Step IQ provides high-accuracy measurements for error detection.
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