Used KLA / TENCOR Alpha Step IQ #9200158 for sale

KLA / TENCOR Alpha Step IQ is a next-generation wafer testing and metrology equipment. This system is used to accurately measure and inspect a broad range of wafer parameters, including surface topography, electrical resistivity, and other optical characteristics. KLA Alpha Step IQ has a configurable platform that offers the flexibility needed for the inspection of a wide variety of wafer sizes, from traditional ¼ inch and 2 inch sizes to larger 300mm wafers. The unit offers advanced metrology capabilities, with an unsurpassed range of measurement capabilities, including high-precision nanometer-scale topography measurements, frequency response measurements and nanoscale electrical resistivity measurements. These measurement capabilities are bolstered by the AI-driven tactile recognition algorithms available on TENCOR ALPHASTEP IQ. This machine can analyze tight surface topographies through the use of specialized tactile probes. The probes can detect features as small as 100nm, allowing the tool to identify and recognize different kinds of defects on the wafer surface. In addition, ALPHASTEP IQ provides a range of automated processes to reduce labor costs and streamline the manufacturing process. It has built-in image processing software that can automatically pick features on wafers, and its integrated random defect detection algorithm can identify small defects that may not be visible to the human eye. The asset also offers a sophisticated automated wafer mapping capability, allowing for increased consistency and accuracy in defect detection. Finally, KLA / TENCOR ALPHASTEP IQ offers an intuitive user interface that makes operation of the model straightforward and easy to use. This facilitates quick training of personnel who use the equipment, and allows for efficient operation and maintenance. All operations, including parameter setting, data acquisition, and configuration can be quickly and easily conducted from the central control station. In summary, Alpha Step IQ is a powerful wafer testing and metrology system that has a range of configurable options to enable the effective measurement and detection of wafer defects. Its automated processes and user interface make it an ideal solution for a range of wafer inspection and metrology needs.