Used KLA / TENCOR Alpha Step IQ #9205705 for sale

KLA / TENCOR Alpha Step IQ is a high-performance wafer testing and metrology equipment designed to measure the critical electrical and physical parameters of microchip wafers. The system uses proprietary measurement algorithms to achieve high accuracy and ultra-low uncertainty. The unit utilizes a high-resolution imaging machine to inspect up to 3400 dpi in both 2D and 3D formats. This enables the tool to provide detailed information about the surface structure and topography of the microchips. The asset also includes an advanced optical microscope allowing operators to review samples on a high-magnification, pixel-by-pixel basis. Advanced automated analysis tools provide on-board data analysis, including graphical and numerical trend analysis for real-time process optimization. A machine vision inspection automatically detects anomalies in the wafer structure and reports on areas of concern. KLA Alpha Step IQ includes a high-speed wafer mapping model to enable multiple wafers in different batches to be tested simultaneously. This allows increased outputs with testing times being reduced to a fraction of the time compared to that of single-wafer testing. It also provides the scope to link multiple systems in a network, allowing multiple operators to work together with one equipment monitoring the progress of all the systems. Data collected from the numerous steps of the testing process can be stored and used to generate in-depth reports for even more detailed analysis of the wafer tests. The system also comes with a range of accessories, such as gas handling systems, temperature probes, and thermal management tools. These ensure the accuracy and reliability of the measured parameters are maintained, and any deviations from the process flow can be quickly rectified. TENCOR ALPHASTEP IQ was the first measurement unit certified by Semes to meet the stringent SEMI C57 standard, ensuring standards of quality and wafer testing reliability. This certification was the result of meticulous research, development, and engineering, and is testimony to the advanced testing capabilities of this wafer testing and metrology machine.