Used KLA / TENCOR Alpha Step IQ #9215025 for sale

KLA / TENCOR Alpha Step IQ is a powerful wafer testing and metrology equipment that enables accuracy and throughput like never before. The IQ is designed to inspect and analyze semiconductor wafers with greater accuracy and speed than ever before, as well as scan for defects and provide valuable process insight. KLA Alpha Step IQ is based on KLA proprietary white-light confocal imaging technology. This allows for greater accuracy and speed as white-light and confocal imaging can create 3D-measurement records for the surface of each wafer. These records provide a top-down view of any defects, forming a vital part of the overall wafer test. The testing process also involves collecting real-time wafer surface information that can be tracked over multiple measurements, ensuring repeatable results and superior detection capabilities. One unique feature of the IQ is an advanced self-calibration procedure which keeps the system running at maximum accuracy while also maintaining the data integrity of the results. TENCOR ALPHASTEP IQ is also certified for ISO/IEC 17025 calibration and report suite requirements. This allows for standardizing measurements with greater precision than before, so that different users are able to retrieve, analyze and compare data between different IQ systems without the need for manual calculations. Additionally, the unit is capable of analyzing samples simultaneously with multiple spectroscopic techniques, such as roughness, critical dimension, reflectance & topography. In addition to providing real-time data insights about wafer test results, Alpha Step IQ also simplifies metrology operations with easy-to-use data analysis software that can reduce time spent on data collection and analysis. The device also helps reduce operational costs and increase efficiency overall, as each ALPHASTEP IQ eliminates the need for additional hardware. With TENCOR Alpha Step IQ metrology and wafer inspection machine, TENCOR and KLA / TENCOR have made it possible to provide wafer testing and metrology with greater accuracy and speed than ever before. The tool eliminates the need for specialized hardware and simplifies metrology operations in a cost- and time-efficient manner by utilizing a proprietary white-light confocal imaging technology and advanced self-calibration to provide reliable, repeatable results.