Used KLA / TENCOR Alpha Step IQ #9361399 for sale

KLA / TENCOR Alpha Step IQ is a wafer testing and metrology equipment designed to meet the stringent requirements of the semiconductor industry. It combines advanced optics and optics assembly with hardware-accelerated algorithms for fast, accurate and repeatable metrology of optical components. It is based on advanced software and hardware, comprised of a high-speed imaging system, optically optimized metrology algorithms and a patented optical interferometry unit. The platform provides three dimensional topographical images of wafers, enabling quick inspection of semiconductor wafer surfaces. It has a maximum wafer size of 200mm, with up to 16,000 steps across the wafer, with imaging resolution of 1nm or better. The patent-pending interference machine is capable of measuring features down to 1nm, with a sampling resolution of 0.5nm per step. The optics assembly includes a grating tool to produce an interference pattern for high-contrast imaging of wafers with different materials or topography. This allows better detection of small features and surfaces. KLA Alpha Step IQ provides advanced analysis and reporting capabilities, with up to 16,000 steps, supporting greater concentration of data and automated calibration/alignment. Its automated alignment capability enables precise control over imaging parameters, and its reporting capability provides extensive analysis for precise metrology with micron-level resolution. Its full graphical user interface provides an easy and intuitive design for custom analysis. TENCOR ALPHASTEP IQ includes advanced optics, optics assembly, and imaging systems, also providing real-time feedback to adjust parameters over time. It is controlled by a powerful software package, with an embedded real-time operating asset to manage data collection, analysis and report generation. The software is customizable, and offers a wide variety of analytical tools for data management. KLA / TENCOR ALPHASTEP IQ platform is designed to ensure precision and accuracy in metrology, enabling greater efficiency and quicker turnaround times in semiconductor device fabrication. It offers scalable performance for advanced device designs, potential for increased fabrication yield, as well as guarantees of greater reliability. The product is suited for use with a variety of materials and substrates, empowering semiconductor device engineers with the information they need for effective design and optimization.