Used KLA / TENCOR Altair 8900 #293654980 for sale

It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.

KLA / TENCOR Altair 8900
Sold
ID: 293654980
Inspection system 2015 vintage.
KLA / TENCOR Altair 8900 is a wafer testing and metrology equipment used for measuring and testing semiconductor components during the manufacturing process. It is designed for improved measurement accuracy, high throughput, and consistent results for exceptionally small components. KLA Altair 8900 utilizes a patented 'reticle and mask' metrology solution that continuously scans across the entire wafer surface. This technique produces precise data, and is further enhanced by the inclusion of an onboard digital signal processor for precise edge detection capability. The system also features an advanced vision unit that collects and processes high-contrast image data. This includes high sensitivity and signal-to-noise ratio detection of tiny variations in the surface of the wafer. TENCOR Altair 8900 is a precise, efficient, and intuitive wafer testing and metrology machine, allowing efficient wafer testing while minimizing setup and maintenance time. Its modular design and ergonomic components reduce fatigue and fatigue-related errors, allowing operators to easily configure, test, and capture results quickly and accurately. This can also be done off-site, which is further facilitated by the tool's networking capabilities, as well as its non-intrusive, easy-to-use data analysis and reporting software. Altair 8900 also offers a range of additional features, including an Integrated Mapping Asset, an Auto Calibration feature, a Defect Viewer, and a Reticle Capture Library. The Integrated Mapping Model quickly maps a device's electrical characteristics, displaying them accurately on the computer screen for quick comparison and analysis. The Auto Calibration processes ensures that the equipment quickly calibrates itself when in use, and it can also be run manually for more precise results. The Defect Viewer displays detailed photographs and information of defects, while the Reticle Capture Library allows users to store and access a range of wafer capture images. Overall, KLA / TENCOR Altair 8900 is an advanced, reliable and precise wafer testing and metrology system that offers a range of powerful capabilities. With its extensive range of advanced features, the unit can successfully test and measure extremely small components with accuracy and speed. It is an intuitive and easy-to-use platform that minimizes setup, configuration, and maintenance time, while providing consistent and reliable results.
There are no reviews yet