Used KLA / TENCOR ASET F5 #293605775 for sale

ID: 293605775
Vintage: 2000
Film thickness measurement system Single open cassette, 8"-12" DUV Lamp Summit 5.2 DBS SE PatMax Operating system: Windows XP 2000 vintage.
KLA / TENCOR ASET F5 is a wafer testing and metrology equipment that is designed for high throughput and accurate analysis for integrated circuits. The system is capable of performing optical inspection, defect review, and a variety of other tests. KLA ASET-F5 is designed to maximize yield at high-volume waferfoundries and advanced semiconductor device fabrication facilities. The unit utilizes the latest in technology, such as the TruMap optical inspection machine and the AlphaStep Surface Metrology. The TruMap tool uses high-resolution optics to "trumap" a wafer, allowing defect detection and recognition of top-level and high-aspect ratio defects. TruMap also allows for a very efficient defect review process. The AlphaStep Surface Metrology measures physical parameters such as resistivity and sheet resistance. It does this in a non-destructive and non-contact manner, providing a more accurate representation of the feature patterns of a wafer. This asset is capable of switching between measurements of wafer resistivity and sheet resistance, thus providing the opportunity for greater flexibility and accuracy. TENCOR ASET F 5 model also includes a high-resolution imaging equipment for defect review. This system allows for quick review and identification of defects. The unit includes features such as narrow band imaging, line scan imaging, full-wafer mapping, and defect-orientation maps. All of these features provide users with a full view of the wafer and its surface. The machine also has a high-precision yield-monitoring tool. This asset monitors yields on a process-by-process basis and can provide early warning of any potential fault or issue on a device. Yield-monitoring systems are invaluable for maintaining and optimizing the process to ensure high yields and device quality. Finally, ASET-F 5 model also includes a Secure Event Recorder. This recorder can be used to keep records of all wafer testing and metrology operations, allowing users to trace back any device or process issues and ensure that only quality devices are produced. In summary, KLA / TENCOR ASET F 5 is a wafer testing and metrology equipment that is designed for high throughput and accurate analysis for integrated circuits. It utilizes the latest in technology with features such as TruMap optical inspection, AlphaStep Surface Metrology, high-resolution imaging, and a secure event recorder. This system offers a comprehensive platform for achieving high yields and device quality, enabling manufacturers to maximize yields at high-volume wafer foundries.
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