Used KLA / TENCOR ASET F5x #293609512 for sale

KLA / TENCOR ASET F5x
ID: 293609512
Film thickness measurement system.
KLA / TENCOR ASET F5x is a wafer testing and metrology equipment used for testing and measuring features on semiconductor wafers. The system is equipped with innovative features for varying wafer sizes ranging from 8-inch (200 mm) to the latest advancements in 12-inch (300 mm) wafers. The hardware components of KLA ASET-F5X unit include: an ultra-high resolution sensor to capture images of the wafer, an ASIC processor to translate the images for further analysis, a high-performance computing software to produce instant results, and an ergonomic and automated loading/unloading robot for wafer handling. The machine is designed to facilitate the testing process and correct any wafer imperfections quickly, reducing resolution, compensation and absorption losses. This is achieved through advanced, automated particle size measurement and analysis, combined with the ability of the tool to accurately measure step, flatness and edge acuity to determine the quality of the wafer. The image acquisition process of TENCOR ASET F 5 X asset is also equipped with enhanced automation techniques, such as an automated particle size measurement and an optimized calibration sys. tem, coupled with full-Frame capability and gradient-based imaging. These tool selections and capabilities guarantee a high-resolution and full-field 3D image of the wafer, allowing users to identify any irregularities. The sophisticated software used with KLA ASET F5x model contains a comprehensive library of features and algorithms for characterization, defectivity, surface specifications, and yield analysis of high-precision wafers. It also features a flexible graphical-user-interface with a live-view that can be used to analyze image data and view wafer trends. Users can track and display defect and quality statistic through real-time data analysis, allowing for fast decision-making processes and yield improvement. In conclusion, ASET F 5 X is an excellent wafer testing and metrology equipment that provides a seamless pathway to automated and accurate results. The system is designed to facilitate the accurate testing and measurement of wafers, enabling users to quickly identify and correct any imperfections and irregularities. The advanced software and automation features of the unit make the process efficient and allow for fast and accurate results.
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