Used KLA / TENCOR ASET F5x #9165996 for sale

KLA / TENCOR ASET F5x is a wafer testing and metrology equipment developed by KLA Corporation (formerly known as TENCOR) and is widely used in the semi-conductor industry. It is a fully automated, high-precision system designed to meet the challenges of modern semiconductor production and process control. The unit allows for the capture and analysis of images acquired by its optics, as well as photometric measurements on multiple wafers at once. Its high-resolution sensors can detect subtle differences in wafer reflectance, enabling accurate measurement of device parameters such as thickness and refractive index. KLA ASET-F5X features a large format camera for wide area imaging and scan-type measurements. It is designed to capture and analyze images with resolutions up to 21,600x13,000 pixels, covering a wide range of parameters from trace metals, dopants, composition, and wafer microstructure. The machine also features a high accuracy photometric reader for measuring device parameters that are dependent on the light conditions. This allows for accurate determination of device parameters such as thickness and refractive index, as well as the identification of defects. The tool is highly automated, enabling rapid and efficient analysis of large volumes of data. Its automated techniques and algorithms are designed to reduce the time needed to analyze data. Its highly modular architecture also allows for easier integration with other systems, increasing overall efficiency. The asset also includes a flexible user interface with an intuitive set of tools to quickly identify areas of interest. It is compatible with most industry standard computer networks, and other software packages, which makes it easier to integrate the model into the existing production environment. Overall, TENCOR ASET F 5 X is a reliable, high precision equipment designed to ensure maximum accuracy and efficiency in the production of complete technological processes. Its highly accurate sensors and tools provide an effective way to accurately measure device parameters, identify defects, and quickly analyze data.