Used KLA / TENCOR ATI I Surfscan #9292752 for sale

KLA / TENCOR ATI I Surfscan is a state-of-the-art wafer testing and metrology equipment used in the fabrication of integrated circuits and semiconductor devices. It is an automated surface defect inspection system that is highly precise and reliable, capable of detecting microscopic defects in wafers and nanostructures. The unit is designed to perform two basic operations: surface scanning and metrology. Surface scanning involves performing a diagnostic scan of the wafer surface to identify any surface defects on the wafer. The machine is equipped with a special lens and lighting tool that allows it to detect microscopic defects on the wafer surface. This allows it to identify imperfections, including scratches, surface particulates, and other features that are invisible to the naked eye. Metrology is the process of measuring the properties of a wafer and related device components. With KLA ATI I Surfscan, operators can measure a variety of metrology parameters, including width, length, deflection, tilt, profile, and thickness. Advanced features of the asset allow operators to measure entire wafers and 3D nanostructures with unparalleled accuracy. In addition to the imaging and metrology capabilities, the model is designed to provide data analysis and reporting capabilities as well. Data from scanning and metrology processes can be transmitted to external databases or collected in the equipment for further analysis. This helps operators create comprehensive reports on the condition and quality of the wafer. Operators can also generate custom reports and charts to identify trends and anomalies in their measurement data. Overall, TENCOR ATI I Surfscan is an invaluable tool for wafer manufacturing and semiconductor device applications. It can help operators identify microscopic defects, measure device properties, and analyze data for reporting purposes. By leveraging this system, operators can optimize their processes for increased efficiency and quality assurance.