Used KLA / TENCOR Candela 6100 #293597433 for sale

KLA / TENCOR Candela 6100 is a state-of-the-art wafer testing and metrology equipment designed for measuring the electrical properties of wafers with the highest possible accuracy and throughput. The system's advanced optics, advanced automation, and flexible platform make it the ideal choice for high-throughput, high-precision testing in a wide variety of semiconductor manufacturing processes. KLA Candela 6100 is equipped with a 5-axis positioning stage for accurate wafer movement. The unit's integrated metrology machine is capable of measuring features down to 1μm. Advanced pattern-matching algorithms, high-accuracy automated controls, and on-board image analysis capabilities allow for rapid wafer characterization and pattern recognition. In addition, the tool can adapt to a wide range of wafer sizes, types and thicknesses. The asset offers a range of test parameters, such as contact resistance, critical dimension, current-voltage characteristics, pitch, and photoresistivity. It also offers multiple test modes and algorithms to test a variety of wafer topographies. Its high-resolution optics provide an extensive field-of-view that allows for up to 128 probes per wafer. The model is powered by a highly capable DSP (Digital Signal Processor) with a state-of-the-art ASIC-based control architecture, which provides improved accuracy and speed. It is equipped with a full suite of real-time diagnostics, alerts, and alarms to ensure optimum performance. The user interface is simple and intuitive, enabling quick set up and operation. The user-friendly Windows-based control software allows for access to parameters, data, and analysis results. The equipment also includes a built-in calibration and qualification package, which ensures repeatable wafer testing accuracy. TENCOR Candela 6100 is an advanced wafer testing and metrology system designed for accurate, high-throughput measurements in a variety of semiconductor manufacturing processes. Its flexible platform, advanced optics, and advanced automation ensure the highest levels of accuracy and performance. The unit's intuitive user interface and powerful DSP provide a reliable and comprehensive solution for demanding wafer testing applications.