Used KLA / TENCOR Candela 6100 #293597434 for sale

ID: 293597434
Vintage: 2007
Optical surface analyzer 2007 vintage.
KLA / TENCOR Candela 6100 is a powerful multi-functional wafer testing and metrology equipment that offers advanced inspection, metrology and extended defect detection capabilities. The system is designed to identify and analyze a variety of design, process and manufacturing related parameters such as topography, lines, edge roughness, defects, bond paths and bumps. KLA Candela 6100 utilizes a unique and patented 'Smart Sweep' technology that actively acquires data over a wide range of the field of view and characterizes the test step by step. This ensures accuracy and high data repeatability, while improving test throughput. The unit also features an advanced defect brokering mechanism that classifies and categorizes defects according to type and size to provide a more detailed analysis of the sample. TENCOR Candela 6100 further offers powerful visualization and analysis capabilities. Its data analytics tools provide users with powerful visualization tools and image metrics for quantitative evaluation of wafer defects. The machine supports multiple languages, such as C++ and Python, allowing users to customize the tool according to their needs. Furthermore, Candela 6100 can be integrated with other test and metrology systems and comes with automated sample loading and handling, allowing for unattended operation. The high performance of KLA / TENCOR Candela 6100 helps enhance throughput, and is ideal for semiconductor wafer quality control. It is also highly reliable, requires minimum maintenance and can be easily integrated into automated test environments. Thanks to its automated data acquisition and analysis capabilities, the asset can quickly detect defects, making it an ideal choice for efficient quality control of a wide range of products.
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