Used KLA / TENCOR Candela 6100 #293610124 for sale

KLA / TENCOR Candela 6100 is a wafer testing and metrology system designed to accurately measure and analyze the properties of semiconductor wafers. It is a highly sophisticated system that utilizes both optical and laser metrology technologies to determine various key metrics including extended defect topography, symmetry, particle size and distribution, optical reflectivity, flatness, overlay accuracy and more. The system is comprised of two main components: the laser interferometer and the imaging module. The laser interferometer uses beams of laser light to measure wafer topography with sub-nanometer accuracy. It is capable of providing detailed defect topography images with a resolution down to 6nm. The imaging module uses a combination of highly sensitive CCD cameras and advanced pattern recognition algorithms to acquire images from the wafer surface. This module enables users to visualize the spatial and surface properties of the wafer, including the shape and structure of any defects. To further increase the accuracy of results, KLA Candela 6100 is equipped with a powerful data analysis tool. Data from both the laser interferometer and imaging module can be combined and analyzed on-site to create a comprehensive report that documents the results of metrology-based testing. This report can then be used to identify and diagnose any anomalies and make necessary adjustments to the production process. TENCOR Candela 6100 is an effective tool for wafer testing and metrology. Its high-tech components and powerful analysis capabilities allow it to provide users with highly accurate, detailed measurements of wafer properties and patterns. This, in turn, helps to ensure that all wafers produced remain within specifications and meet the highest production standards.