Used KLA / TENCOR Candela 8600 #9311388 for sale

KLA / TENCOR Candela 8600 is a wafer testing and metrology equipment designed for semiconductor manufacturing applications. The system utilizes an advanced optics unit to enable high-resolution, high-speed measurements. It is capable of rapid defect detection and classification on both frontside and backside wafer surfaces. The machine features a 10-axis, computer-controlled wafer stage to handle a wide range of wafer diameters and types. It is equipped with a high-resolution camera (2.3 megapixel) that allows areal scanning of the wafers with up to 400 x 400 nm resolution. The inspection speed is adjustable from slow to ultra-fast and the measurements are provided with high accuracy and repeatability. KLA Candela 8600 is powered by KLA ultra-fast C8T imaging processor which is capable of combining 4-dimensional in-line microscopy, wire-grid imaging and electron beam technology. This allows the tool to detect and classify defects at incredible speeds. The advanced imaging algorithms used by the C8T processor also enable a wide range of automated and manual analysis tools, including defect height mapping, 2-dimensional morphological analysis, and traditional electrical testing. The asset can be interfaced with other TENCOR metrology systems in order to provide a comprehensive end-to-end wafer testing and inspection solution. It also features an intuitive user interface for operator convenience and streamlined workflow. In addition, the model offers a wide range of advanced optics and imaging features. These include automated defect recognition algorithms, a light-field depth range monitor, and capability to store and analyze up to 60 gigapixel images at any given time. The equipment also offers an impressively large sample size coverage (up to 5 inches) which makes it ideal for the inspection of semiconductor wafers, solar cells and other large substrates. Overall, TENCOR Candela 8600 wafer testing and metrology system is an impressive tool for semiconductor manufacturing inspection and analysis. It is equipped with a powerful processor, advanced optics unit and user-friendly interface, and provides highly accurate, repeatable measurements at an impressive speed.