Used KLA / TENCOR Candela 8620 #293794168 for sale

KLA / TENCOR / PROMETRIX Candela 8620 is a state-of-the-art wafer testing and metrology equipment designed for semiconductor fabrication and development. KLA Candela 8620 is capable of precisely measuring a semiconductor wafer's critical electrical characteristics, for example its threshold voltage, current, capacitance and voltage-frequency characteristics. This system is designed for measuring thin-film, thick-film, and bare die wafer configurations. TENCOR Candela 8620 is able to map electrical characteristics of a wafer with high precision and accuracy at accelerated scan rates. It is built upon a robust and sophisticated architecture which includes a precision amplified scanner, contact head and time-resolved pressure sensor. This enables the scanner to measure a wide range of properties from die-to-die across the entire wafer, including capacitance, resistance, charge, and number of lithography layers. The unit incorporates advanced metrology capabilities, such as advanced algorithms for feature extraction and a variety of electrical component testing methods. Candela 8620 is able to detect abnormalities and defects in a wafer quickly and accurately, significantly improving throughput and yield. Furthermore, PROMETRIX Candela 8620 enables stress testing and reliability testing with unmatched speed and accuracy. KLA / TENCOR / PROMETRIX Candela 8620 is equipped with a range of sensors and processing components to provide accurate, repeatable measurements. In addition, the machine includes a wide range of control and measuring systems to ensure accuracy and consistency throughout the process. This includes a multi-axis control tool with integrated linear motors and servo amplifier, a Z-axis alignment stage, and precision capacitance probes. KLA Candela 8620 is compatible with a wide range of wafer fabrication and metrology tools, including ion implantation, lithography, etching, sputtering, and deposition tools. This enables the asset to integrate seamlessly into an existing semiconductor fabrication line. Finally, the model is compatible with a variety of software tools, including data acquisition, graphing, analysis, and post-processing, for a comprehensive and efficient solution for wafer testing and metrology.