Used KLA / TENCOR Candela C2 #293663071 for sale
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KLA / TENCOR Candela C2 is a wafer testing and metrology equipment designed to provide comprehensive testing and analysis of silicon wafers in order to ensure their reliability and performance. The system uses optical comparators and scattering systems to accurately measure microscopic features, and features such as lens correction and the software's intuitive user interface allows for the most detailed and accurate wafer testing available. The unit is made up of multiple components, including an x-z platform, a laser scanning head, and a monochromatic, low-intensity beam. The x-z platform allows for precise and accurate positioning of wafers, enabling the user to test very small features. The laser scanning head contains a high-performance diode module that emits a light beam to the wafer, while the monochromatic, low-intensity beam allows for precise and delicate testing, ensuring accurate results as well as safety. KLA Candela C2 also utilizes a range of different cameras and sensors, such as a mid-infrared camera for measuring micro-defects and a scatterometer for determining the level of scattering on the wafer surface. Additionally, the machine features an automated imaging tool, which is capable of detecting and analyzing any irregularities. It also contains an automated data backup asset and is also capable of controlling the exposure parameters for various testing applications. One of the key advantages of TENCOR C2 is its high accuracy and low cost. The model produces highly accurate results, specifically regarding wafer characteristics such as feature size, thickness measurements, and defect size. In addition, its low cost of operation makes it an ideal solution for a variety of industries. In conclusion, Candela C2 is a comprehensive wafer testing and metrology equipment designed to provide precise and accurate results as well as safety for its users. Its low cost of operation makes it a great choice for a variety of industries, especially those that rely on quality-control processes. Thanks to its innovative components and features, the system is able to produce highly accurate measurements and data analysis that are used in manufacturing and engineering environments.
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