Used KLA / TENCOR Candela C2 #9277067 for sale

KLA / TENCOR Candela C2 is an advanced wafer testing and metrology equipment that combines wafer scanning, test and inspection, and imaging capabilities in one integrated platform. KLA Candela C2 system offers optimized testing and measurement solutions for semiconductor device manufacturing. TENCOR C2 unit is designed to meet the demanding requirements of the semiconductor device manufacturing industry. Its high-precision testing and metrology capabilities ensure accurate and reliable characterization of wafer characteristics like electrical and optical properties, defect density, and topography. It is composed of an automated handler, an automated wafer prober, an optical microscope, and a scanning electron microscope, which are all capable of performing high precision measurements in a variety of wafer applications. The automated wafer prober is capable of testing up to 38 wafers in sequence and provides a wide range of probing capabilities. The optical microscope in TENCOR Candela C2 machine provides high-resolution imaging capability with five different imaging modes, which can be used for defect mapping and process quality control. The integrated scanning electron microscope allows for precise measurement of wafers down to 0.1 micron resolution. It also includes an energy-dispersive X-ray spectrometer (EDS) which enables the tool to analyze materials composition. Finally, the asset is connected to a set of metrology platforms such as an interferometer, a scatterometer, and a surface profiler, which enable more detailed probing of device structures. C2 is renowned for its reliability and high performance, as well as its ability to adapt to changing testing and metrology requirements. It also benefits from several features such as bar-code wafer tracking, automated data handling, and remote access, allowing users to monitor their operations from any location. Overall, KLA / TENCOR C2 model is an impressive all-in-one wafer testing and metrology equipment that can accurately and reliably characterize wafer characteristics. Its integrated design, high precision, and wide range of testing and metrology capabilities make it an ideal choice for semiconductor device manufacturers.