Used KLA / TENCOR Candela CS1 #293585686 for sale

KLA / TENCOR Candela CS1 is a wafer testing and metrology equipment for measuring the electrical properties and physical profile of integrated circuits (ICs). The system consists of a self-contained, dual-view, X-Y-Z stage, wafer spin chuck and optical microscope. It is designed to provide detailed dimensional measurements and characterize the electrical characteristics of integrated circuits on die and wafers. The powerful imaging and illumination capabilities of KLA Candela CS1 allow it to accurately measure the electrical properties of ICs. The unit is capable of measuring the dark current and voltage responses, as well as leakage current, of a wide range on test pads. In addition, the machine can measure other electrical parameters such as impedance, capacitance, and inductance, with the help of specialized interfaces. The tool also offers a large imaging field of view and can measure image features down to 0.1um. TENCOR Candela CS1 has an integrated handle and a measurement station, to allow for rapid wafer loading and unloading. The intuitive graphical user interface also makes operating the asset simple and cost efficient. Additionally, the model is equipped with a high-definition camera equipment for defect and failure analysis, as well as advanced features such as Dielectric Constant (Dk) Stress, Variance, High Resolution Overlays, and an advanced statistical quantification module. Candela CS1 also offers a comprehensive set of feature extraction and analysis algorithms. Features such as Bevels, Cuts, Grooves, and clearances are quickly and accurately measured by the system. Measurement data can be exported in various common data formats, to enable easy reporting and archiving of data. The unit is backed by a robust support network, ensuring that maintenance and operational needs are promptly addressed. Overall, KLA / TENCOR Candela CS1 is an ideal wafer testing and metrology tool for measuring electrical parameters, medium level dimensional features, and extracting critical design information for chip designers. With its accurate, fast, and comprehensive metrology capabilities, it is the ideal choice for advanced semiconductor testing and measurement.