Used KLA / TENCOR Candela CS1 #9399871 for sale

KLA Candela CS-1 is a wafer testing and metrology equipment designed for semiconductor device manufacturing. The system provides high-resolution optical inspection of wafers and integrated circuit (IC) packages to detect any particles, defects and other anomalies. It features an automated wafer handling unit, advanced lighting systems, and high-speed image capture. The machine also includes image analysis and classification software to detect small particles, defects and other anomalies. The Candela CS-1 has a modular design, allowing users to custom-configure the tool to meet their specific needs. The asset has several lighting options to enhance wafer imaging and defect detection. These lighting systems include brightfield, darkfield, edge illumination, polarized light, and ultraviolet illumination. The automated wafer handling model is designed for high throughput and allows for automatic wafer cleaning and wafer loading. The equipment is also expandable, allowing for additional microscope modules. The system includes a built-in image capture unit that provides high-resolution images of even the smallest feature sizes. The image capture machine includes a color CCD camera and range of magnifications from 5X to 200X. It also includes image capture software for image capture, image analysis, and classification. TENCOR Candela CS-1 offers wafer-level electrical test and process control features, such as automatic voltage and current control. This tool is designed to be compatible with many different wafer processes, including lithography, assembly, dicing, and polishing. Additionally, the asset includes a testing model that can be used to perform defect detection and device characterization. This equipment can provide detailed information on device critical parameters such as capacitance, leakage current, resistance, breakdown voltage, and current drift. The Candela CS-1 system also provides an integrated data management unit. The data management machine provides a powerful reporting tool, allowing users to quickly and easily generate reports on device performance, defect detection, and process control. Users can also access and analyze historical data to quickly identify and address any problem areas in the manufacturing process. Overall, KLA / TENCOR Candela CS-1 asset is a powerful tool for the detection and characterization of semiconductor devices. The model provides high-resolution imaging, a wide range of illumination systems, advanced image capture technology, process control features, and integrated data management for a comprehensive wafer inspection and metrology equipment.