Used KLA / TENCOR Candela CS10 #153587 for sale

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ID: 153587
Surface Inspection system 120/280 V, 60 Hz, 20 Amps Nitrogen: 4 SCFM @ 80PSI 1/2"FNPT Compressed Dry air: 6SCFM @ 80PSI 1/2"FNPT Vacuum: 2CFM at 28" HG 1/2"FNPT Cabinet plenum drain (Dry plenum) 2"FNPT Fume exhaust: 1400CFM @ .75" of water 2006 vintage.
KLA / TENCOR Candela CS10 is an automated wafer testing and metrology equipment. It is an 11-axis, air-bearing system capable of performing a wide range of wafer tests and metrology checks in a highly efficient manner. Its features and capabilities make the unit ideal for assessing the quality of both logic and memory wafers. KLA CANDELA CS-10 is used to measure the electrical performance of a variety of semiconductor die including logic, processors, flash memory, dynamic random-access memory (DRAM), and memory test electrodes. The machine is equipped with a 1000mm stage, a multi-axis motion controller, and a range of advanced metrology tools. It offers high throughput, fast scanning speeds and precision metrology. To ensure accuracy, the tool has a built-in detection and correction capability that constantly monitors the asset's performance. TENCOR CANDELA CS 10 utilizes the latest technology in vision-based wafer inspection and semi-conductor vision. The model has an ultra-fast head, multiple optical objectives, and a host of vision systems and algorithms to detect, track and analyze defects on a wafer. Additionally, the equipment's vision subsystems enable the user to assess the performance of individual devices, wafers and sub-wafers. The system offers diode, memory, and discrete transistor testing capabilities as well as full 1,288-point CV characterization. This allows the user to characterize and benchmark the performance of all components in an integrated circuit. KLA CANDELA CS 10 provides a wide range of data acquisition, analysis and reporting functionality, enabling the user to assess process development time and cost reductions. The unit also features metrology capabilities allowing the user to measure cell alignment down to 0.5 micro-meters. Through the integration of proprietary algorithms with advanced metrology tools, it helps to assess and evaluate process quality, topography and defect trends. The advanced machine also has adaptive motion control, allowing the operator to specify a coordination tool and program a new motion trajectory to meet specific needs. Furthermore, the asset offers online diagnostics, advanced alarms, and error-logging capabilities. CANDELA CS 10 is a highly accurate and efficient tool for wafer testing and metrology. It offers a range of advanced capabilities, making it ideal for assessing the quality of semiconductor wafers. From diode testing to memory characterization, the model provides an unparalleled level of accuracy and offers a significant benefit to the overall process optimization.
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