Used KLA / TENCOR Candela CS10 #293585673 for sale

KLA / TENCOR Candela CS10 is a front-end semiconductor metrology equipment designed to enable automated and repeatable measurements on semiconductor wafers. This system is capable of measuring a variety of wafer parameters such as size, thickness, surface flatness, pattern, and placement accuracy. KLA CANDELA CS-10 is a highly-automated metrology unit with a modular design that offers a wide range of metrology capabilities. The machine's core components comprise a motorized X-Y scanning stage, an optical head, an optical detection tool, and control software. The motorized stage moves the wafer back and forth across the optical head, while the optical head uses a laser to take wafer measurements. The measurements are transmitted to the control software, which uses proprietary algorithms to process the data and produce accurate results. TENCOR CANDELA CS 10 features a high-precision optical detection asset capable of accurate measurements down to 0.1 nm. The model also features automated calibration routines and high dynamic range detectors, which allow for the acquisition of accurate measurements over a wide range of measurements including large and small features. TENCOR Candela CS10 offers a high level of reliability and flexibility. The equipment is capable of performing measurements on a wide variety of wafer materials, including Gallium Arsenide, Silicon, and Silicon-on-Insulator. It also offers a wide range of measurement parameter settings, including wafer orientation, spot size, and scan speed, enabling users to customize the system for their specific applications. The unit is also highly intuitive and user-friendly, allowing users to configure and adjust settings quickly and easily. TENCOR CANDELA CS-10 is a cost-effective, dependable machine that can help improve the accuracy and efficiency of wafer testing and metrology processes. Its modular design makes it easy to install, configure, and operate, and its automated calibration routines help ensure highly accurate results. Its intuitive user interface and wide range of measurement parameters make the tool an ideal choice for any wafer testing or metrology processes.