Used KLA / TENCOR Candela CS10 #293628472 for sale

KLA / TENCOR Candela CS10 Wafer Testing and Metrology equipment is an automated system for inspecting, analyzing and measuring the electrical performance of semiconductor wafers. The unit is capable of detecting manufacturing defects as small as 0.08µm, making it an ideal tool for advanced semiconductor processing and advanced device fabrication. KLA CANDELA CS-10 consists of multiple components, including a high-resolution optical microscope, a vision machine, and an integrated measurement and analysis tool. The optical microscope uses a variety of lenses, including standard, long length, zoom and telecentric lenses, to capture precise images of the wafer surface. It uses laser illumination and contrast techniques to identify tiny defects, including cracks and pits, in the wafer. The vision asset of TENCOR CANDELA CS 10 analyses the images taken via the microscope and provides three-dimensional information about the wafer. This is enabled through its powerful pattern recognition algorithms. This allows for a wide range of parameters to be tested such as pit size, orientation, and shape. The integrated measurement and analysis model of KLA / TENCOR CANDELA CS-10 leverages multiple imaging capabilities to measure the electrical performance of the wafer. It is capable of measuring electrical properties such as voltage, current, and complex impedances. It can also measure high frequencies, low frequency signals, high power, and high contrast. In addition, it is able to measure the thermal performance of the wafer, providing accurate temperatures when measuring high-power signals. In addition to its imaging capabilities, Candela CS10 features a robust data storage equipment that allows users to store, analyze and transfer data. It is equipped with both conventional hard drives and a high-speed semiconductor storage system, allowing large amounts of data to be quickly accessed, analyzed and stored. CANDELA CS-10 is an invaluable tool for analyzing and measuring the performance of complex semiconductor devices. It offers the highest accuracy and highest resolution available today, making it an ideal tool for advanced process and radio frequency manufacturing. With its numerous components, powerful pattern recognition and measurement capabilities, and robust data storage unit, CANDELA CS 10 is a powerful and versatile tool for optimizing semiconductor device fabrication and testing.