Used KLA / TENCOR Candela CS10 #293637902 for sale

KLA / TENCOR Candela CS10 is a wafer testing and metrology equipment that has been designed to provide exceptional accuracy and high throughput for semiconductor applications. The system is capable of handling wafers up to 300mm, and it provides simultaneous contact and non-contact measurements, as well as automated data analysis and reporting. The unit features a high-resolution optical microscope with an automated auto-focus and wavelength calibration machine, allowing users to inspect crystalline defects, measure total thickness variation, and determine via topography. The tool's 4-port, dual head surface profiler is capable of capturing intermediate layers, high aspect ratios, and narrow, deep via-holes. Additionally, the asset includes two particle sensors, two color 3D mapping sensors and two scatterometry instruments, allowing users to quickly and accurately measure and analyze surface finishes, particle disputes and line-edge roughness. The model is highly configurable, allowing it to be tailored to specific applications and customer requirements. It also includes a number of automation features, such as an integrated automatic equipment identification, a patented nozzle cleaner and a 24/7 monitoring feature. Moreover, the system supports a range of advanced algorithms that allow it to accurately characterize the many nonlinear effects found in modern lithographic processes. As a result, users can ensure that their wafers are within spec and consistently meeting their requirements. Thanks to its sophisticated design, KLA CANDELA CS-10 offers a number of advantages over other wafer testing and metrology systems. It is highly accurate, enabling users to measure and analyze even the smallest variations in wafer properties. It also provides high throughput, allowing for quick and reliable wafer characterization. Furthermore, the unit is highly configurable and includes many advanced and automated features to ensure that users get the most out of their testing and metrology machine.