Used KLA / TENCOR Candela CS10 #293659394 for sale

KLA / TENCOR Candela CS10 is a state-of-the-art wafer testing and metrology equipment capable of automating the production of wafers. It is designed to optimize the development and process control of thin film transistors and other non-linear element structures. It is capable of conducting signal integrity tests, timing measurements, parametric and functional testing, and defect analysis with its powerful instruments and software. The CS10 can accommodate a wide variety of wafers, ranging from 200 mm up to 450 mm in diameter. It can measure both the physical characteristics of wafer as well as the electrical characteristics. It has precise wafer-to-stage and wafer-to-plane alignment with laser alignment technology. The standard model of the CS10 includes an FPD/CMOS LIV system, an electric probe station, a microscope, two auto-alignment wafer holders, an X-Y stage, and a variety of other hardware and software for optimized wafer testing. The software package for the CS10 has several features to accelerate wafer testing and measurement processes. It allows for a fully automated sequence of wafer testing processes, such as signal integrity tests, timing measurements, parametric and functional testing, defect analysis, and a variety of other tests tailored to meet specific device requirements. The FPD/CMOS LIV unit allows for the playback of arbitrary test waveforms for device testing and characterization. It has a reflective design to improve performance and reduce outside interference. It also includes a sampling oscilloscope and arbitrary waveform generator for time and frequency domain measurements of electrical signals. The probe station offers quick and accurate probes for device measurements and characterization. It utilizes an XY electromechanical stage to position the probe while making precision contacts with the terminals. The optical microscope provides an automated measurement machine for visual inspection of the device contacts. KLA CANDELA CS-10 also has a feature called SEMIQ. This feature allows for fast, efficient wafer testing and metrology. It can handle multiple wafers, allowing for parallel testing. The user-friendly interface simplifies wafer handling, reducing time and costs for the testing and metrology process. By combining these powerful instruments and software, TENCOR CANDELA CS 10 is one of the most advanced wafer testing and metrology systems available. It offers reliable and precise wafer measurement and testing, as well as fast and accurate data acquisition. Its user-friendly interface and powerful hardware and software make it an essential tool for wafer testing and metrology.