Used KLA / TENCOR Candela CS10R #9372904 for sale

KLA / TENCOR Candela CS10R is a wafer testing and metrology equipment used for precision wafer testing, metrology, and characterisation. The system is designed to support process engineers with tool and tape processes, height control, form measurement and defect analysis in semiconductor production lines. It can be used for a variety of applications including wafer mapping, defect detection, and particle analysis. The unit includes a vision inspection machine, an optical microscope, and a wafer camera tool to detect defects and particles on a semiconductor wafer. The vision asset is designed to enable high-speed, high-precision analysis that quickly detects and categorises even the tiniest of defects. The optical microscope supports direct imaging of samples, enabling a high-resolution view of a wafer. This enables effective detection of both surface topography and structural features. Lastly, the wafer camera can take wide view shots of the entire wafer surface, enabling high-quality images to be used for defect detection and analysis. The model is integrated with cutting-edge software for analysis, providing real-time process monitoring, automated defect categorisation and data analysis. This allows process engineers to quickly detect process issues and pinpoint any potential problems, allowing them to make necessary adjustments to the process in order to improve yield and device performance. In addition, the equipment offers a range of automated handling processes. This includes an automatic wafer mapping system which can track a wafer's measurements and map any potential defects, and an automated wafer transfer unit which accepts wafers using a robotic arm. KLA Candela CS10R provides a powerful combination of features and automation for wafer testing and metrology. It enables fast and accurate defect detection and analysis, as well as automated handling and mapping processes. This helps process engineers identify and address any issues with a semiconductor production line, resulting in improved device performance and yields.