Used KLA / TENCOR Candela CS10V #293651565 for sale

KLA / TENCOR Candela CS10V is a wafer testing and metrology equipment designed to provide reliable measurements at the micro- and nano-scale level. It utilizes the latest in high-precision optics, lasers, detectors, and image processing technology to accurately measure features such as the thickness and topography of wafers and chips. The system is equipped with a 3-axis, nanometer-scale, motorized stage for precise sample positioning and automated, non-contact alignment. The unit also offers high throughput with its multi-channel optics, variable-speed scanning, and versatile data collection and analysis capabilities. The high-speed image processing algorithm allows for rapid detection and scanning of defects, while the patented laser alignment technololgy ensures accurate imaging of all sample features. Furthermore, the software utilizes cutting-edge statistical approaches and machine learning algorithms to implement data-driven processes such as yield preditions, defect mapping, and process characterization. The data acquired by the CS10V can also be used to investigate failure and reliability trends, thus enabling proactive troubleshooting and maintenance of the manufacturing process. Automated report generation based on the analysis results sets the machine apart as a tool that can perform large-scale data analysis with minimal manual effort. The tool is also available with extended yields diagnostics and texture mapping features, making it a versatile tool for wafer testing and metrology.