Used KLA / TENCOR F5x #293587509 for sale

KLA / TENCOR F5x is a wafer testing and metrology equipment designed to achieve high levels of accuracy and speed in testing wafer substrates and measuring surface defect levels. This high-tech instrument uses advanced optics and multispectral imaging technology to create detailed images of the surface being tested, allowing for the identification and quantification of wafer defects. The system is capable of scanning a wafer in both the front and back sides, capturing images at different angles and measuring height profile, size, and position of micro-structures with great precision. KLA F5x also has the ability to detect varying levels of contrast in surface material, and is capable of inspecting reflective surfaces as well. The unit boasts an automated flatness algorithm which ensures accuracy down to the atomic level, making it more than capable of performing high-end metrology needed for leading-edge semiconductor applications. This includes flaw posturing for ramp and defect characterization, tapered and patterned surface inspection, and masking. TENCOR F 5 X machine's optical metrology includes CCD imaging which uses hundreds of statistical variables to measure and detect surface defects from substrate backside, sidewalls, and top surfaces. This can lead to quicker development times as features can be easily inspected and detected, as well as accelerated production speeds. F 5 X also has the ability to map and classify samples into a variety of categories, such as defects, good, intermediate, or bad wafers. KLA / TENCOR F 5 X tool is easy to use and has features that make it ideal for researchers, product developers, and production engineers alike. It can be used as a stand-alone asset or integrated with a factory automation. The flexibility of KLA F 5 X model allows its users to configure it to meet specific needs, such as sorting by defect levels, creating masks, or setting the sensitivity for each product. Overall, TENCOR F5x wafer testing and metrology equipment is a reliable, precise, and highly efficient tool for inspecting and measuring surfaces with accuracy. With its advanced optics, imaging technology, and automated algorithms, F5x system can quickly detect and quantify surface defects, measure flatness down to the atomic level, and produce detailed images of the surface being tested.