Used KLA / TENCOR F5x #9270868 for sale
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KLA / TENCOR F5x is a wafer testing and metrology equipment designed for semiconductor production. It uses advanced optical imaging and inspection technologies to optimize production process yields, while ensuring uniformity across all wafers. The system utilizes an automated wafer lifter to transfer wafers between the imaging and analysis chambers, allowing the user to accurately and quickly analyze and inspect each wafer. The unit includes two high-resolution cameras, one positioned for imaging and one for automated inspection. The imaging camera captures data from the wafers at a resolution up to 30nm, enabling precise and fast data collection. This data is then analyzed using proprietary algorithms to create sophisticated 2D images of the wafers. The inspection camera also utilizes high-resolution optics to capture defect data, which is automatically analyzed and reported to provide easy to interpret inspection results. KLA F5x uses advanced scanning technologies such as brightfield, darkfield, fluorescence, and cross section imaging to generate high-resolution images over a wide range of wavelengths. These images are then analyzed using advanced algorithms to detect defects, nonuniformities, and other characteristics within the wafer. This data is then used to generate quality metrics such as wafer yield, device performance, and defectivity. The machine is also equipped with an in-situ sample temperature and environment control tool, which can be used to monitor contamination levels and reduce the effects of environmental influences. This is achieved by restricting the fluctuations in temperature and air pressure that can affect wafer results. TENCOR F 5 X also contains a wide range of features designed to increase process speed and accuracy. These include a direct connection to asset operability, automatic wafer status updates, image registration, and an integrated production model. All of these features combined make KLA F 5 X an ideal choice for semiconductor manufacturers who require high-speed, accurate wafer testing and metrology.
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