Used KLA / TENCOR Flexus 2320 #9187354 for sale

KLA / TENCOR Flexus 2320 is an advanced, high-speed wafer testing and metrology equipment designed to rapidly measure the electrical, optical, topographical, and withstand voltages of wafers. Specifically, KLA Flexus 2320 wafer testing and metrology system is capable of testing and analyzing up to 20 samples simultaneously, with a rapid testing speed of up to 2300 measurements/second. This high-speed unit is also able to measure a wide range of wafer sizes - up to 8 inches - with minimal alignment errors. TENCOR Flexus 2320 offers advanced measurement capabilities, including dynamic voltage force microprobe testing (DVFMT) and non-destructive testing (NDT). DVFMT enables the machine to quickly and effectively measure the current without damaging the wafer, thus ensuring accurate testing. The NDT feature enables the tool to gain resilient information on the electrical properties of samples by using optical techniques, such as Fourier transform infrared spectroscopy (FTIR). Other key features of Flexus 2320 include an automated metrology station, an integrated review/fail subsystem, an automated data analysis asset, and an intuitive graphical user interface. The integrated review/fail subsystem allows for efficient management of pass and fail test data by standardizing the interpretation of results from wafers. The automated data analysis model enables advanced analysis of the electrical, optical, topographical, and withstand voltage properties of samples. The intuitive interface simplifies operation, allowing for improved efficiency and accuracy. KLA / TENCOR Flexus 2320 is designed for use in industrial, research, and academic laboratory settings. This equipment is ideal for applications such as wafer-level device testing, process variation analysis, and packaging qualification. The system is also compatible with a variety of process technologies, such as CMOS, BJT, and FET. KLA Flexus 2320 is an advanced, high-speed wafer testing and metrology unit capable of providing accurate and comprehensive testing and analysis of wafers. This machine offers state-of-the-art features and reliable results, making it a suitable choice for a wide range of research, industrial, and academic applications.