Used KLA / TENCOR Flexus 5400 #9399076 for sale

KLA / TENCOR Flexus 5400 is an advanced wafer testing and metrology equipment developed to provide sophisticated quality control and yield enhancement for the semiconductor industry. It is a fully integrated automated system that offers optimal performance for advanced inspection and metrology hardware, comprehensive software, and application expertise. It is designed to meet the standards of the most demanding semiconductor manufacturers and offers exceptional throughput and accuracy. KLA Flexus 5400's high-precision hardware components include an integrated industrial vision unit for active and passive viewing, a scoring and counting machine, and a variety of probes, optics, and motion units. The machine's 8-axis motion tool enables dynamic indexing and precision positioning and allows for dynamic inspection of various wafer sizes. The asset also includes a comprehensive software package that provides automated control and data processing, as well as comprehensive visual feedback. TENCOR Flexus 5400's software suite can measure complex 3D features of high performance devices and provides powerful algorithms for measurements such as particle and defect detection, as well as automated pattern recognition. The model also supports powerful inspection and metrology modes, including Optical Projection Tomography (OPT) and Contour Scan. Through its integrated analysis suite, Flexus 5400 can quickly identify anomalies, such as viruses, and then provide detailed feedback to manufacturers. KLA / TENCOR Flexus 5400 also provides a secure and robust network architecture to ensure data security. It includes an integrated Distributed Data Protection equipment to provide secure transmission and storage of data across multiple physical locations. The system can also be integrated with centralized manufacturing quality and test management systems for faster and more accurate identification of defects and better yield control. KLA Flexus 5400 is a powerful and advanced wafer metrology unit designed to provide precise and repeatable measurements with minimal operator intervention. Its integrated vision machine, precise motion control, and data processing capabilities enable precise inspection and metrology of advanced manufacturing processes. Its integrated software, security layers, and network systems combine to give manufacturers the ability to monitor their wafer processes in real time, detect problems, and take corrective action quickly to ensure optimal yields.