Used KLA / TENCOR Flexus F2320 #293751864 for sale

ID: 293751864
Wafer Size: 8"
Thin film stress measurement system, 8" Chuck size, 8" Temperature range: 500°C Laser scanning to measure stress Measures and displays stress Data analysis capabilities Plotting for Statistical Process Control (SPC) 3-D Map of wafer deflection entire surface Bi-axial modulus of elasticity and linear expansion Operating system: MS-DOS.
KLA / TENCOR Flexus F2320 is a wafer testing and metrology equipment designed for industrial quality control in the production of semiconductors. It allows manufacturers to test the characteristics of each chip during fabrication, providing valuable insight into product quality before the chips enter the packaging process. KLA Flexus F2320 measures a wide range of electrical, physical, and optical properties of products in high-volume semiconductor fabrication. It is capable of imaging even the smallest micro features in an integrated circuit and measuring parameters such as minimum space and feature size in real-time. The system's advanced imaging capability is achieved through its Beam Controlled Scanner (BCS) that controls the beam positioning, programming, and size. This ensures minimal aberrations when detecting even the most intricate micro-electronic features. The BCS can be used to magnify the object of examination up to 900 times to view and measure miniscule components. TENCOR Flexus F2320 also offers reliable accuracy and repeatability. Its advanced calibration-correction algorithms and powerful image-alignment methods ensure precise and dependable measurements. The unit is equipped with a Laser Mode feature, which allows manufacturers to accurately measure the parameters of laser-etched features, such as anti-reflective layers and protective coatings on chips. The FE-CV (Focusing Error Control and Verification) feature further enhances accuracy by providing clear, waveform-based focus control on chip images of up to 16 pins. Flexus F2320 is an efficient machine that can be customized and configured to suit a variety of production environments. It provides real-time monitoring and feedback during the production process for improved yields and quality assurance. Moreover, its VibroChrome technology allows production line operators to instantly detect any micro-defects and contamination such as scratches, chips, and particles in the wafers to ensure a defect-free product. Overall, KLA / TENCOR Flexus F2320 represents an advanced, reliable, and efficient wafer testing and metrology tool designed to precisely measure any micro-features and defects on chip images to guarantee the highest production quality.
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