Used KLA / TENCOR FLX-2320 #9371825 for sale

KLA / TENCOR FLX-2320 is a powerful and precise wafer testing and metrology equipment, designed to allow for precise measurements that can be used in industrial process control. This system is equipped with the latest in a range of state-of-the-art optical and electrical technologies, which provides the highest level of accuracy in measuring wafers. The unit is highly versatile, capable of testing a wide range of wafer materials, from silicon to germanium, and has a capability of measuring small structures or large, with a maximum wafer diameter of up to 200 mm in diameter. It is capable of measuring a wide range of physical properties of the wafer, such as thickness, topography, surface contamination, surface defects, and electrical and optical characteristics. KLA FLX-2320 is equipped with a number of cutting-edge technologies, such as AutoFocus, which allows the optics to stay in focus while the measurement is being taken. By utilizing the latest technologies in imaging and detector technology, TENCOR FLX 2320 is capable of delivering precise measurement results at high speeds. In order to ensure flawless performance, the machine is designed with a number of special features. TENCOR FLX-2320 employs non-destructive local lasers and low-energy ion bombardment (LEIB) to accurately detect breakouts, pinpoint changes in substrate layers, and measure pits and bumps without affecting previous measurements. Furthermore, closed-loop scan control allows for precise positioning of the wafer under test. In addition, the metrology tool is designed to be highly convenient for the user. With its auto-calibration feature, FLX-2320 can be used with a minimum amount of set-up and does not need to be recalibrated. The asset also has automated data acquisition and analysis functions, allowing for easy set up, comparison and troubleshooting of the results. From production to process control to quality control, KLA FLX 2320 provides accurate and reliable wafer testing and metrology. With its advanced technologies and features, it is capable of providing the highest level of accuracy and precision in wafer measurement and analysis.