Used KLA / TENCOR FLX-2320S #293609348 for sale

KLA / TENCOR FLX-2320S is a specialized equipment designed for wafer testing and metrology. Designed to be a flexible, high-throughput system with the latest technological capabilities, KLA FLX 2320 S can rigorously analyze and measure the performance of a variety of devices and applications. The centerpiece of TENCOR FLX-2320-S is the integrated metrology measurement subsystem, which offers a variety of probes for electrical and optical wafer testing. This includes the ability to measure a wide range of physical attributes such as topography, signal integrity, dielectric layer thicknesses, interconnectivity, and mechanical properties. In addition, the metrology measurement subsystem can also capture complex data sets such as topography maps for post-process analysis. To capture this data, KLA FLX-2320S is equipped with high-resolution, low-noise cameras with advanced image processing algorithms. These algorithms allow the unit to measure features on the micro and nanometer scale with unprecedented accuracy and repeatability. KLA / TENCOR FLX 2320 S also features a sophisticated vision machine with automated defect inspection capabilities. This tool can scan an entire wafer, detecting any issues with die or feature size and shape, as well as positional and orientation identification of die. It can also inspect for surface defects in wafer coatings or structures. In addition to these features, KLA / TENCOR FLX-2320-S also includes integrated analytic capabilities for analyzing and reporting test results. This includes the ability to generate comprehensive reports for advanced analysis, as well as graphical results for easy review of process data. Overall, TENCOR FLX-2320S is an invaluable tool for the development and production of modern semiconductor devices and substrate technologies. With its combination of comprehensive testing and metrology capabilities, FLX-2320-S provides an unprecedented level of precision and detail for wafer testing and analysis.