Used KLA / TENCOR FLX-2320S #293636666 for sale
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ID: 293636666
Vintage: 2007
Thin film stress measurement system
Dual wavelength
Substrates, 8"
Statistical Process Control (SPC)
2-D, 3-D views of wafer topography
Operating system: Windows 7
Power supply: 220 V, 50/60 Hz, 15 A
2007 vintage.
KLA / TENCOR FLX-2320S is a high accuracy wafer testing and metrology equipment designed to provide superior performance and flexibility. This system can handle wafers up to twelve inches and offers advanced performance with high precision and throughput. The unit was designed with the user in mind and utilizes a precision optical imaging machine and a dynamic user interface to provide consistent, accurate results. KLA FLX 2320 S utilizes the latest in optical imaging technology to capture images of the wafer's surface with maximum accuracy and resolution. The tool is compatible with many types of wafers such as silicon, glass and composite materials, and features an adjustable illuminator for optimal light reflection. In addition, TENCOR FLX-2320-S features a high speed, dual-axis linear motor asset to ensure smooth and precise wafer positioning. The model also includes advanced metrology capabilities, such as a comprehensive measurement library and a host of integrated driver functions to maximize results. The onboard operating equipment allows users to easily collect and analyze metrology data in real time. FLX 2320 S also features an automated focus control system, allowing users to accurately and quickly measure parts of a chip with precision. In addition to its advanced features, the unit also features a user-friendly human-machine interface (HMI). This intuitive machine provides an easy-to-navigate user interface to help users easily and quickly access features, change parameters, and review results quickly and accurately. The tool also features an alarm monitor for enhanced wafer safety and support for remote operation. TENCOR FLX-2320S is an advanced wafer testing and metrology asset that delivers maximum accuracy and reliability. With its precision optical imaging model and intuitive HMI, this equipment provides users with maximum flexibility and control over their metrology results. This system is ideal for use in wafer characterization and testing applications, where accuracy and speed are of the utmost importance.
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