Used KLA / TENCOR FLX-2908 #293587318 for sale

KLA / TENCOR FLX-2908 is a 'wafer testing and metrology' equipment used to measure and monitor a wide range of semiconductor parameters. The system includes a number of modules that have been designed to handle test and measure on a variety of different semiconductor processes and substrates, with the aim of providing an accurate and reliable tool for validating device performance. KLA FLX-2908 unit uses a high resolution imaging machine to capture images of the wafer surface, providing accurate and detailed information about its features and composition, allowing for precise and specialized metrology measurements in a range of geometrical directions. The included FTIR spectroscopy module measures a range of parameters for wafer tests, such as thickness and passivation layer uniformity, material composition and resistivity. TENCOR FLX 2908 tool is equipped with advanced algorithms for volume defect and non-volumetric defect detection. These algorithms are based on the evaluation of texture and light emission maps and the verification of the material's optical properties. Additionally, the asset can be set to scan wafers at the highest speed available, making it an ideal choice for testing large numbers of wafers during production. The characteristics of TENCOR FLX-2908 can be tailored to meet the individual testing requirements of each user and process. The included materials qualification toolbox helps ensure that the results match the desired standards, making it easy to quickly adjust the settings if necessary. KLA / TENCOR FLX 2908 is also capable of data tracking, allowing users to save and analyze results from past tests. This allows users to compare different tests and efficiently track the progress of their processes. Additionally, the results are readily accessible for further analysis and can be used for data based decisions, helping the user manage the entire wafer process more effectively. Overall, FLX-2908 is an invaluable tool for anyone involved in the development and production of semiconductors, offering an easy-to-use and high-quality solution for testing and monitoring a wide range of materials and processes. The model's powerful features, combined with its robustness and flexibility, make it the perfect choice for any wafer testing and metrology requirement.