Used KLA / TENCOR FLX-2908 #293590721 for sale

KLA / TENCOR FLX-2908 is a fully-automated, comprehensive wafer testing and metrology equipment (WTSM) designed for the semiconductor industry. It combines the latest in precision metrology and testing tools with powerful software and statistics handling, to quickly and accurately characterize multiple wafer surfaces and provide consistent, reliable results. KLA FLX-2908 is suitable a wide variety of wafer sizes and applications, with a variety of probes, mags, and camera configurations. TENCOR FLX 2908 is designed to measure not just distance measurements and flatness, but also surface roughness, stress levels, and readability. The measurement instrumentation is designed to quickly characterize the wafer surface, providing detailed results that meet or exceed industry standards. FLX 2908 is a highly versatile, easy to use system, with automated test setup, data acquisition, and analysis functions. The unit features high-resolution video microscope and digital video capture, simple user interface, and computer-aided-design 3D (CAD3D) model overlay for quick and easy dimensional measurement. KLA / TENCOR FLX 2908 also includes an array of tools for surface irregularities analysis and automated peak identification. TENCOR FLX-2908's statistical analysis machine also offers an ISO traceability-level control of the wafer test results. It includes software tools like traceability databases, to store and compare test results, automated statistical analysis processes and tools, and an easy to understand graphical user interface. The values displayed in the graphical user interface are constantly updated according to the real-time tests run on FLX-2908. Powerful programmability and automation capabilities are included in KLA FLX 2908's software. The automated settings and protocol follow-up ensure repeatable results, while the graphical user interface enables a variety of user-defined parameters to be entered and recalled. In summary, KLA / TENCOR FLX-2908 is a powerful wafer testing and metrology tool, suitable for various wafer sizes and applications. It combines automated test setup, data acquisition and analysis, high-resolution video microscope, digital video capture, and statistical analysis software, making it a reliable, accurate, and versatile solution for fast and repeatable test results.