Used KLA / TENCOR FP-20 #293661858 for sale

KLA / TENCOR FP-20 is a versatile, high-performance wafer testing and metrology system that facilitates reliable inspection of integrated circuits (ICs). It is a complete solution that provides full coverage for all aspects of wafer testing, including fast, accurate measurements of electrical properties of various types of IC devices. KLA FP-20 system is built on precise and repeatable instrumentation for wafer testing and metrology. It leverages a high-resolution laser interferometer that allows accurate measurements of wafer size, shape, position, and topography. This ensures efficient testing of a wide range of IC devices, including CMOS, bipolar, and SOI devices. TENCOR FP-20 also features advanced software algorithms and an intuitive user interface. This enables automated, accurate, and repeatable wafer testing that requires minimal user involvement. The software also supports multiple wafer types, allowing for efficient testing of both standard and non-standard IC devices. FP-20's optical metrology capabilities provide a number of unique advantages over traditional methods, including improved test result repeatability and accuracy. Its measurement capabilities also enable faster wafer testing, as the high-speed scanning provides fast, precise measurements in a reduced timeframe. KLA / TENCOR FP-20 also includes a number of advanced features that can help streamline wafer testing. It offers fast and accurate measurements of multiple parameters, including device sheet resistance, resistance-voltage, capacitance-voltage, and resistance-capacitance. This enables reliable characterisation and stress test of ICs with unmatched accuracy. All in all, KLA FP-20 is an advanced wafer testing and metrology system for quality assurance and process control. It offers advanced features and benefits, including precise and repeatable instrumentation, fast and accurate measurements, and robust electrical characterisation. All of these features provide the foundation for reliable and efficient wafer testing.