Used KLA / TENCOR FT-500 #9409301 for sale

KLA / TENCOR FT-500 equipment is a powerful wafer testing and metrology system that delivers superior performance, accuracy and precision for complex wafers. This unit is the perfect choice for both the R&D lab and the production environment. With its sophisticated hardware and intelligent software, KLA FT-500 provides an unmatched degree of control, analysis, and precision that is essential for optimizing wafer performance, reducing defects, and improving yield. TENCOR FT-500 machine is designed to accommodate a wide range of wafer sizes, from 300mm to 1 cm, enabling excellent performance on both small-scale and large-scale wafer testing and metrology. With an advanced and intuitive user interface, FT-500 offers unrivaled ease of use while offering a full suite of advanced analysis and measurement capabilities. These capabilities include advanced 2D metrology with wafer mapping, 3D metrology with topography, particle detection, and wafer pattern recognition, as well as surface defect inspection, and many other advanced features. KLA / TENCOR FT-500 tool also features exemplary image resolution and image processing capabilities that allow for highly accurate defect detection and analysis. The powerful data acquisition engine of KLA FT-500 enables high-speed data collection and analysis, making processing of large data sets an easy task. The asset also features auto-focus and edge profilometry for more accurate measurement and data collection. TENCOR FT-500 model is a complete package of integrated hardware and software solutions that include comprehensive data processing, analysis, and feedback capabilities. This equipment is also designed to be highly configurable, allowing users to customize their system's setup and workflow to suit their specific needs. All of these features come together to make FT-500 a powerful wafer testing and metrology unit that delivers superior performance, accuracy, and precision at an economical price. KLA / TENCOR FT-500 machine is the perfect choice for wafer testing and metrology applications.