Used KLA / TENCOR FT-750 #293750959 for sale

KLA / TENCOR FT-750 wafer testing and metrology equipment is a versatile, automated, complete metrology platform for inspecting and testing high-density, thin-wafer devices. Designed for use in the advanced IC design and device manufacturing processes present in today's semiconductor industry, KLA FT-750 system offers superior accuracy, precision, and throughput. This robust, expandable unit optimizes throughput and cost, allowing for reduced test time and improved product yield. TENCOR FT 750 machine employs a variety of metrology tools to ensure the highest quality in testing and analyzing the thin ICs, thin film layers, and other features of advanced ICs. This includes a powerful 2D Optical Profiler to measure feature depth and diameter, a CD-SEM microscope to measure line widths and minimum line edge roughness (LER), and an Atomic Force Microscope to measure surface topography. TENCOR FT-750 also operates a variety of high-resolution probing technologies, such as electrical-image force microscopy (EIFM) and Kelvin probe microscopy, to measure device properties at a sub-surface level. In addition to the advanced metrology functions, FT 750 offers numerous features to speed up the testing and metrology process. Automatic inspection tools help increase throughput by streamlining the process for analyzing data, and automatic device alignment capability eliminates the need for manual alignment and increases yield. Tool firmware can also be updated with new releases to provide faster, more accurate test results. With an easy to use, intuitive user interface, KLA FT 750 is an extremely flexible, reliable, and productive wafer testing and metrology asset. Operators can save time and ensure optimal results as a wide variety of configurations can be created to accommodate a variety of device types and applications, such as flip chip devices, optoelectronics and MEMS. The user can select parameters such as feature size and tolerances, device geometry, and sample configuration in order to produce the most accurate results possible. Overall, KLA / TENCOR FT 750 provides the highest level of accuracy and throughput for wafer testing and metrology. Its superior image quality, expandability, and easy-use user interface make it the ideal model for IC development and manufacturing. Its combination of metrology tools, automatic properties, and device alignment capability adds significant efficiency to the testing and metrology process, allowing for reduced test time and improved product yield.